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Author: Sonia Ben Dhia
Edition: 2006
Binding: Kindle Edition
ISBN: B000WD7RZQ
Edition: 2006
Binding: Kindle Edition
ISBN: B000WD7RZQ
Electromagnetic Compatibility of Integrated Circuits: Techniques for low emission and susceptibility
Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focusesAon the electromagnetic compatibility of integrated circuits. Get Electromagnetic Compatibility of Integrated Circuits computer books for free.
The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines Check Electromagnetic Compatibility of Integrated Circuits our best computer books for 2013. All books are available in pdf format and downloadable from rapidshare, 4shared, and mediafire.
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Electromagnetic Compatibility of Integrated Circuits Download
The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations he basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines
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